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The world’s fastest real-time oscilloscope
(Agilent Technologies 90000 X-Series) Agilent 33500 Series Function / Arbitrary Waveform Generators LXI Data Acquisition / Switch Unit (Agilent Technologies 34972A) Arbitrary Waveform Power Source (GW Instek APS1102) GLC-9000 Leakage Current Tester (GW Instek GLC-9000) Programmable DC electronic loads (GW Instek PEL-2000) JTAG Live the free circuit-board debug tool (JTAG Technologies JTAG Live)
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Computer Controls AG ist die Vertretung für Agilent Technologies in der Schweiz
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NEWThe world’s fastest real-time oscilloscope90000 X-Series are the world’s fastest real-time, windows-based oscilloscopes with the highest real-time scope measurement accuracy, the only 30 GHz probing system and the industry’s most comprehensive application specific measurement software. - Industry’s best: 32 GHz true analog bandwidth - 80 GSa/s sample rate 2 channels / 40 GSa/s sample rate 4 channels - Industry deepest memory with up to 2 Gpts memory (10 Mpts standard/20 Mpts standard on DSA models) - The highest real-time scope measurement accuracy - Industry’s highest true analog bandwidth (twice the analog bandwidth of leading competitor) - Industry’s lowest oscilloscope noise floor (2.31 mVrms at 32 GHz at 50mV/div) - Lowest measurement noise floor (<100 fS) - Industry’s first 30 GHz oscilloscope probing system - Fully customized probe amplifier s-parameter characteristics provides accurate probe correction for each individual probe amplifier - Industry’s first bandwidth-upgradeable probes mean you will be prepared for your evolving probing needs for more Information click here
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Agilent 33500 Series Function / Arbitrary Waveform Generators Dual-Channel Capability
Waveform Generation
Instrument Features
The Agilent 33521A 1-channel 30 MHz function / arbitrary waveform generator and the 33522A is a 2-channel 30 MHz function / arbitrary waveform generator. They offer the highest signal fidelity and implements a breakthrough technology that provides you with the ability to generate more accurate arbitrary waveforms. With 10x better jitter than anything in its class, it offers unparalleled control of signal frequency for your most challenging measurements.
Unique to the 33522A model is a flexible, dual-channel mode with frequency and amplitude coupling, differential channels, and combined output channels. This functionality is particularly useful in applications where testing a device relies on the timing and interaction of two distinct signals to operate properly, such as a heart pacemaker.
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![]() ![]() 34972A
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The new LXI Data Acquisition / Switch
Unit
34972A, Features:
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Need
an Arbitrary Waveform Power Source? No Problem! The APS-1102 is not only in the role as a precision AC/DC power source but also a powerful analyzer, containing abundant features for the testing and characteristic analysis of power supplies, electronic devices, components and modules. Besides providing AC/DC power, APS-1102 also allows free programming of outputs for the simulation of a power source with abnormal variations. The instantaneous interruption, frequency sweeping, voltage sweeping and arbitrary waveforms of power source can be easily generated in accordance with the test requirements. The output function includes two main modes, AC and AC + DC. Each mode can be combined with any of the four signal sources, internal (INT), external (EXT), internal + external (ADD), and synchronization, to give an ultimate flexibility of power source setting. APS-1102 includes a multi-functional and user-friendly software, which supports the remote control of panel operations, Sequence editing and execution, Arbitrary waveform editing and transfer, and Data logging via USB interface. With capacity of 1kVA power and weighting of 20 lbs, APS-1102 provides powerful test and analysis features all in a comparatively compact and light-weight box.
Features:
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The GLC-9000, leakage current tester, is used to perform leakage
current (or called touch current) tests on medical electrical (IEC 60601-1) and
general purpose electric & electronic (IEC 60990) equipment. This tester engages
with nine measurement networks (or called Measuring Device) to provide the
simulation of human body whilst the EUT (equipment under test) is taking a
leakage current testing, in compliance with the specific standards or
regulations such as IEC, UL, JIS...etc.. In order to provide a simple operation environment, the GLC-9000 equips large TFT LCD touch panel to configure system as well as to present the measurement settings information and result simultaneously. Besides, there are 50 preset testing conditions, which conform to IEC60990 and other standards, for general electric equipment can be recalled to reduce the setting time. In addition, 30 sets empty memory are available for user defined.
Features
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Programmable DC electronic loads The PEL-2004 and PEL-2002 are multiple channel, programmable DC electronic loads with a modularized structure. The PEL-2000 Series is designed to meet the continuing shift toward high speed operation in today's semiconductor market. As the power supply units, DC-DC converters, and batteries that drive semiconductor circuits need to follow this shift, power supply design, quality inspection and characteristic certification using high-speed performance loads have become necessary. The PEL-2000 Series includes two types of mainframes and 4 types of load modules to accommodate users' requirements in a flexible manner. Any load module combination can used with a mainframe to tailor a test system based on the number of channels, and the maximum load power, voltage and current of each channel. Multiple loads can be connected in parallel to provide a higher-power load to test higher power supply outputs. This flexibility significantly reduces the investment needed for future projects that have differed power requirements. The PEL-2004 is a 4-slot mainframe with a master control unit to hold 4 load modules, while PEL-2002 is a 2-slot mainframe with master control unit to hold 2 load modules. When the PEL-2004 is configured with 4 load modules rated at 350W each, the PEL-2000 series is able to sink up to 1.4kVA of power. For higher load capacities, mainframes can be linked together in parallel with standard MIL 20-pin connectors. A maximum of 5 mainframes, including one master and 4 slaves can be chained together to create a total load capacity of 7kW for high current and high power applications. Using 4 dual channel load modules, the PEL-2004 is able to test 8 power supply outputs simultaneously. The Sequence function allows each channel to change its load sink according to a predefined sequence at a rate of up to 100 s per step. Each sequence is able to run concurrently, under the control of one clock. This is one of the most powerful features of the PEL-2000 Series as it is able to realistically simulate a multi-output power supply load. Under Dynamic mode, the load current or load resistance pulses between two preset levels at a pre-defined speed up to 25 s per step. This is often used as the standard test procedure to verify the response of a power supply to quick load changes. Most remarkably, multiple load channels can be connected in parallel to run Dynamic tests synchronously under a single clock. This Parallel Dynamic functionality gives the flexibility to perform dynamic tests for a high-power power supply without the need of another high-power load. The PEL-2000 Series includes a number of protection modes: Over Current Protection (OCP), Over Voltage Protection (OVP), Over Power Protection (OPP), Reverse Voltage Protection (RVP), and Under Voltage Protection(UVP). The protection modes are useful to protect both the load modules and the DUT(s). A buzzer can be set for when a protection setting has been tripped. When a protection mode has been tripped, the load unit will display an alarm and stop sinking current/voltage. When a load unit is operating in CR or CV mode, the unit may need Over Current Protection to prevent excessive current being sunk. Over Current Protection stops the load from sinking more current than its recommended limit and prevents the load from burn-out damage. Over Voltage Protection is used to limit the amount of voltage sunk. If the OVP trips, the PEL-Series load will stop sinking voltage. Over Power Protection is used when the input power exceeds the specifications of the load. When OPP is tripped, the power will cease to be sunk. Reverse Voltage Protection prevents reverse voltage damage to the PEL-2000 Series up to the specified rating. When Reverse Voltage Protection has been tripped, an alarm tone will sound until the reverse voltage is removed. Under Voltage Protection will turn off the load when the voltage drops below a set limit. The Go/NoGo function is available to monitor test results all the time. When a test result goes beyond a preset limit range, a "No Go" indication will be shown on the display and a "No Go" signal can be sent out through the D-SUB interface for external device control. This Go/NoGo function is available for CC mode, CV mode and CR mode. Under "Program" mode, 12 programs each containing 10 panelsetupmemories, can be edited to create work routines for repetitive tests. After a program has been executed, the results of all test steps, along with the Go/NoGo judgments, will be shown on the screen. For external control and system configuration, the PEL series has USB and RS232 interfaces as standard and GPIB as an option. The LabView driver and Data Logging PC software are both supported for all the available interfaces. Each channel has an analog control/monitoring connector on the rear panel to externally turn a load on/off and to externally monitor load input current and voltage. Features-Sequence function to do high Efficient load simulations -Flexible configuration with mainframes and plug-in modules -Multiple independent load inputs up to 8 channels in a mainframe -Parallel connection of inputs for increased load capacity -Parallel connection of inputs for static and dynamic tests -Multiple channels run for dynamic tests under one clock control -Maximum rated power for low range high resolution CC tests -Von setting and Von on/off for start-up Von tests -Program mode to create work routines for repetitive tests -OPP/OCP/OVP/OTP protections -External channel control/monitoring via an analog control connector -Multi-Interface USB Device / Host, RS-232C, and GPIB (Optional) -Multi-mainframe link up to 5 mainframes in a system
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JTAG Live the free circuit-board debug tool
Debugging
boards too crowded for
traditional probing just
got a whole lot easier.
Best of all, you can
get started absolutely free of charge with JTAG Live's Buzz module. With Buzz, you can quickly drive, sense and sample pins and simple clusters. Two other modules, Clip and Script, available to order, measure multiple signals and more complex clusters. JTAG Live capitalizes on the boundary-scan resources found on today's complex digital circuit boards. There is no need for a netlist, just the devices' BSDLs, to give you access to all of the I/Os for driving and sensing. Read more about Buzz Get a free copy
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last update 04.08.10
more informations: agilent@ccontrols.ch or info@ccontrols.ch